- 您现在的位置：买卖IC网 > PDF目录68777 > 1215E TEST/JTAG SUPPORT|CMOS|QFP|48PIN|PLASTIC PDF资料下载
参数资料
| 型号： | 1215E |
| 英文描述： | TEST/JTAG SUPPORT|CMOS|QFP|48PIN|PLASTIC |
| 中文描述： | 测试/ JTAG支持|的CMOS | QFP封装| 48PIN |塑料 |
| 文件页数： | 9/92页 |
| 文件大小： | 1041K |
| 代理商： | 1215E |
第1页第2页第3页第4页第5页第6页第7页第8页当前第9页第10页第11页第12页第13页第14页第15页第16页第17页第18页第19页第20页第21页第22页第23页第24页第25页第26页第27页第28页第29页第30页第31页第32页第33页第34页第35页第36页第37页第38页第39页第40页第41页第42页第43页第44页第45页第46页第47页第48页第49页第50页第51页第52页第53页第54页第55页第56页第57页第58页第59页第60页第61页第62页第63页第64页第65页第66页第67页第68页第69页第70页第71页第72页第73页第74页第75页第76页第77页第78页第79页第80页第81页第82页第83页第84页第85页第86页第87页第88页第89页第90页第91页第92页
Agere Systems Inc.
17
User Manual
April 2001
Advanced Operational Mode
497AE and 1215E Boundary-Scan Master 2
Automatic Test Pattern Generation (ATPG), Scan Sequence Modification (SSM),
and Signature Analysis (continued)
Scan-Sequence Modifier (SSM) (continued)
A test algorithm or test generator generates type 1 data. The generated data is a function of the test algorithm and
number of nets, and is independent of the type of nets, their ordering, etc. Type 2 and type 3 data is typically pro-
vided by test generation software that format the test sequences. It is the critical necessity of type 2 and type 3
data that makes it difficult to automatically generate interconnect test sequences in a board- or system-level BIST
environment. The technique that the BSM2 uses takes advantage of the fact that type 2 and type 3 data are static.
Consequently, if the value of this data and its location is recorded once, then it can be easily inserted into the out-
put scan sequence, and used for identifying the cells with useful test information that should be compressed by the
signature analysis register (SAR).
SSM-ATPG Mode
Figure 2 shows the SSM configuration with ATPG as the TDO source and SAR as the TDI destination. To achieve
this configuration SSM is enabled by setting the SSME bit.
Assume there are
L scan cells on the currently selected/attached B-S chain. The type 2 (control) data are placed in
two buffers, occupying
L bits of each buffer. The TVO/TVI memories (each 8K) of the BSM2 serve as the buffers.
There is a one-to-one mapping between the
L locations of these buffers and the L scan cells on the selected/
attached B-S chain. The controlling processor initializes TVI and TVO with type 2 data derived from UUT structural
information. TVI identifies the control cells while TVO identifies input/output cells and supplies the data for control
cells.
A 1 in location
n in TVI identifies a control cell at position n in the selected/attached B-S chain. The value in TVO at
the same location (
n) contains the logic value that must be shifted into that control cell to avoid conflict during test-
ing.
A 0 in location
m in TVI implies that the cell in position m of the selected/attached B-S chain is either an input cell
or output cell during the given test. A 1 in location
m in TVO identifies the cell as an output cell and ATPG is
enabled to supply test data for that cell location. A 0 in location
m in TVI combined with a 0 in location m in TVO
identifies the corresponding cell of the selected/attached B-S chain as an input cell. Since the data for such a cell is
type 3, or filler data, any value can be applied to the scan cell at the corresponding B-S chain location. The BSM2
will always generate a 0 for filler data.
The table below defines the operation of the SSM and its interaction with SAR and the test pattern generator in the
ATPG mode.
Table 1. ATPG Mode with SSM Enabled: How ith Bits of TVI and TVO Encode Cell Type and Control Source
of TDO and Actions of ATPG and SAR Functions
TVI(i)
TVO(i)
Cell Type
ATPG
SAR
Source of TDO
1
1 or 0
control
disable
TDO(i)
0
1
output
enable
disable
ATPG(i)
0
input
disable
enable
constant 0
相关PDF资料 |
PDF描述 |
|---|---|
| 1243-TYPE | Uncooled Laser Transmitter |
| 1245-TYPE | Uncooled Laser Transmitter |
| 125-0212-3 | EINBAUSTECKER PUSH PULL 8POL |
| 125-0213-6 | STECKER PUSH PULL 4POL |
| 125-0214-9 | KUPPLUNG PUSH PULL 4POL |
相关代理商/技术参数 |
参数描述 |
|---|---|
| 1215-EN | 制造商:Thomas & Betts 功能描述:INSERT BUSHING--2 |
| 1215F10 | 功能描述:BATT PK 15.0V AA SIZE CARBN ZINC RoHS:否 类别:电池产品 >> 电池组 系列:Eveready® MSDS 材料安全数据表:Nickel Cadmium Battery MSDS 标准包装:1 系列:Cadnica 电池化学:镍镉 可充电:是 电池大小:D 单元数:10 电压 - 额定:12V 容量:4Ah 结构:正面至背面，5 排 x 2 芯电池 端接类型:焊片 尺寸/尺寸:6.42" L x 1.28" W x 4.63" H（163.0mm x 32.6mm x 117.6mm） 重量:3.5 磅（1.6kg） 请注意:- 配用:SY125-ND - BATT NICAD 1.2V D 4000MAH 其它名称:SY125-L025 |
| 1215F2 | 功能描述:BATT PK 3.0V AA SIZE CARBON ZINC RoHS:否 类别:电池产品 >> 电池组 系列:Eveready® MSDS 材料安全数据表:Nickel Cadmium Battery MSDS 标准包装:1 系列:Cadnica 电池化学:镍镉 可充电:是 电池大小:D 单元数:10 电压 - 额定:12V 容量:4Ah 结构:正面至背面，5 排 x 2 芯电池 端接类型:焊片 尺寸/尺寸:6.42" L x 1.28" W x 4.63" H（163.0mm x 32.6mm x 117.6mm） 重量:3.5 磅（1.6kg） 请注意:- 配用:SY125-ND - BATT NICAD 1.2V D 4000MAH 其它名称:SY125-L025 |
| 1215F2X2 | 功能描述:BATT PK 6.0V AA SIZE CARBON ZINC RoHS:否 类别:电池产品 >> 电池组 系列:Eveready® MSDS 材料安全数据表:Nickel Cadmium Battery MSDS 标准包装:1 系列:Cadnica 电池化学:镍镉 可充电:是 电池大小:D 单元数:10 电压 - 额定:12V 容量:4Ah 结构:正面至背面，5 排 x 2 芯电池 端接类型:焊片 尺寸/尺寸:6.42" L x 1.28" W x 4.63" H（163.0mm x 32.6mm x 117.6mm） 重量:3.5 磅（1.6kg） 请注意:- 配用:SY125-ND - BATT NICAD 1.2V D 4000MAH 其它名称:SY125-L025 |
| 1215F2X3 | 功能描述:BATT PK 9.0V AA SIZE CARBON ZINC RoHS:否 类别:电池产品 >> 电池组 系列:Eveready® MSDS 材料安全数据表:Nickel Cadmium Battery MSDS 标准包装:1 系列:Cadnica 电池化学:镍镉 可充电:是 电池大小:D 单元数:10 电压 - 额定:12V 容量:4Ah 结构:正面至背面，5 排 x 2 芯电池 端接类型:焊片 尺寸/尺寸:6.42" L x 1.28" W x 4.63" H（163.0mm x 32.6mm x 117.6mm） 重量:3.5 磅（1.6kg） 请注意:- 配用:SY125-ND - BATT NICAD 1.2V D 4000MAH 其它名称:SY125-L025 |
发布紧急采购，3分钟左右您将得到回复。