参数资料
型号: 1215E
英文描述: TEST/JTAG SUPPORT|CMOS|QFP|48PIN|PLASTIC
中文描述: 测试/ JTAG支持|的CMOS | QFP封装| 48PIN |塑料
文件页数: 5/92页
文件大小: 1041K
代理商: 1215E
Agere Systems Inc.
13
User Manual
April 2001
Advanced Operational Mode
497AE and 1215E Boundary-Scan Master 2
The BSM2 Scan Process (continued)
Jump and Reset Commands (continued)
Reset Command
This command overrides (halts) any current execution
in any mode and internally resets the BSM2. Executing
the Reset command does not activate the TRST* sig-
nal.
The TAP State Tracker will indicate that the BSM2 has
driven the TAP Controllers of the selected/attached B-S
chain to the Test-Logic-Reset TAP Controller state. It is
necessary to synchronize the TAP State Tracker with
the selected/attached B-S chain by running TCK for five
cycles with the TMS signal equal to 1 or by use of the
TRST* signal.
TAP Manual Mode
In the BSM2, it is possible to single step through a scan
sequence in TAP Manual Mode. TAP Manual Mode is
entered by writing a 1 to the MAN bit of the CUTI regis-
ter.
The key to understanding TAP Manual Mode is the fact
that writing the CUTO register not only supplies values
to be driven on TMS, and TDO, but also produces the
clock edge on TCK that causes the values to be driven.
Likewise, reading the CUTO register not only is a
means of capturing the value concurrently available on
the TDI pin, but also produces the clock edge on TCK
that cause the value in question to be captured from the
output of the selected/attached B-S chain.
The CUTO register includes the bits that enable the
operation of the TAP signals of the BSM2. Each TAP
pin, other than TCK, is represented by a bit in the regis-
ter. There is an additional bit operational in the manual
mode only, TDOEM. In this mode, TDOEM controls
enabling/disabling of the TDO output pin.
Control of TCK Pin
While writing (reading) the CUTO register causes an
internal TAP Manual Mode TCK register to go low
(high), this will not have effect on the value of the TCK
pin of the BSM2 unless the pin is enabled for TAP Man-
ual Mode by having the MAN bit of the CUTI register
set. When the BSM2 is in TAP Manual Mode the nor-
mal connection of the TCK pin to the internal TCK gen-
erator (divider of the master clock) is overridden.
In this way the user can preselect the state of the TCK
pin before going to the manual mode by either reading
or writing to the CUTO register. In other words, once
TAP Manual Mode is selected, the user does not need
to worry about toggling TCK as it is done naturally by
reading and writing to CUTO—with the same phase as
defined in
IEEE Std. 1149.1.
Control of TDI, TDO, TMS, and TRST* pins
In TAP Manual Mode, the next values to be driven on
the TDO and TMS pins of the BSM2 are written to the
TDOM and TMSM bits (respectively) of the CUTO reg-
ister. Enabling/disabling of the TDO pin is controlled by
the value written to the TDOEM bit (unless overridden
by the state of the TOEB bit). Likewise a reset of the
TAP Controllers on the selected attached B-S chain is
effected by writing CUTO with the value 1 in the
TRSTB bit. (The use of the TRSTB bit is not restricted
to TAP Manual Mode.)
In TAP Manual Mode, when the CUTO register is read,
the value output from the selected/attached B-S chain
will be found in the TDIM bit of that register.
Data Modification
TDO Inversion
The value of bits from various internal sources (e.g.,
TVO) and driven by the BSM on its TDO output signal
can be inverted before they are scanned into a
selected/attached B-S chain. This is achieved by the
use of the TC bit (CUTI[02]).
Signature Analysis for Deterministic Tests
The signature analysis register (SAR) can be used to
compress the results of deterministic scan testing as
well as in the case of ATPG. The SAR is selected
through the use of the SSM function. See the descrip-
tion under the headings Signature Analysis for Deter-
ministic Tests, Scan-Sequence Modifier (SSM), and
Programming ATPG and SSM Functions.
Note:
The retimed delay function is not applicable to
scan operation in which the SAR is the target
for data scanned into TDI.
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