参数资料
型号: 1215E
英文描述: TEST/JTAG SUPPORT|CMOS|QFP|48PIN|PLASTIC
中文描述: 测试/ JTAG支持|的CMOS | QFP封装| 48PIN |塑料
文件页数: 8/92页
文件大小: 1041K
代理商: 1215E
16
Agere Systems Inc.
User Manual
April 2001
Advanced Operational Mode
497AE and 1215E Boundary-Scan Master 2
Automatic Test Pattern Generation (ATPG), Scan Sequence Modification (SSM),
and Signature Analysis (continued)
Scan-Sequence Modifier (SSM)
This section describes a circuit called the SSM. It modifies a test sequence to ensure that no bus conflict will occur
before the sequence is passed to the selected/attached B-S chain of the UUT. The modifier also enhances the effi-
ciency of the test pattern generator, and controls the SAR so that only selected values are compressed. This mod-
ule is used for modifying scan sequences in both ATPG and deterministic modes (see Figure 2).
5-6311 (F)
Figure 2. Scan-Sequence Modifier (SSM)
A B-S interconnect test sequence has three types of data:
s
Type 1 is the test data that is to be applied to the output cells, one output cell per net. This data is determined by
the test algorithm. This is the test stimulus information.
s
Type 2 is output control data that determines whether a 3-state pin is active or in high impedance or the direction
of a bidirectional pin. This information is determined by the board structure and does not change during applica-
tion of a particular test algorithm. The control data is required to ensure that no bus conflicts occur due to the
generated test. In general, this is the test information that needs to be held static. An example of this information,
in the case of a cluster test, would be an enable signal that needs to be held low for meaningful tests to be
applied.
s
Type 3 is filler data that is scanned into the input cells at the receiving (input) sides of nets. This data is essen-
tially don’t care and is overwritten when a response is captured by these same cells. Filler data is required to per-
mit the useful data, type 1 and type 2 data, to be scanned to the correct B-S cell positions on the B-S chain. Filler
data is a placeholder for test response data.
0
10
1
00
1
0
11
0
8K
TVO BUFFER
100
1
0
00
0
1
00
1
8K
TVI BUFFER
SSM CONTROL
SAR
TDI
TDO
ATPG
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1215-EN 制造商:Thomas & Betts 功能描述:INSERT BUSHING--2
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1215F2 功能描述:BATT PK 3.0V AA SIZE CARBON ZINC RoHS:否 类别:电池产品 >> 电池组 系列:Eveready® MSDS 材料安全数据表:Nickel Cadmium Battery MSDS 标准包装:1 系列:Cadnica 电池化学:镍镉 可充电:是 电池大小:D 单元数:10 电压 - 额定:12V 容量:4Ah 结构:正面至背面,5 排 x 2 芯电池 端接类型:焊片 尺寸/尺寸:6.42" L x 1.28" W x 4.63" H(163.0mm x 32.6mm x 117.6mm) 重量:3.5 磅(1.6kg) 请注意:- 配用:SY125-ND - BATT NICAD 1.2V D 4000MAH 其它名称:SY125-L025
1215F2X2 功能描述:BATT PK 6.0V AA SIZE CARBON ZINC RoHS:否 类别:电池产品 >> 电池组 系列:Eveready® MSDS 材料安全数据表:Nickel Cadmium Battery MSDS 标准包装:1 系列:Cadnica 电池化学:镍镉 可充电:是 电池大小:D 单元数:10 电压 - 额定:12V 容量:4Ah 结构:正面至背面,5 排 x 2 芯电池 端接类型:焊片 尺寸/尺寸:6.42" L x 1.28" W x 4.63" H(163.0mm x 32.6mm x 117.6mm) 重量:3.5 磅(1.6kg) 请注意:- 配用:SY125-ND - BATT NICAD 1.2V D 4000MAH 其它名称:SY125-L025
1215F2X3 功能描述:BATT PK 9.0V AA SIZE CARBON ZINC RoHS:否 类别:电池产品 >> 电池组 系列:Eveready® MSDS 材料安全数据表:Nickel Cadmium Battery MSDS 标准包装:1 系列:Cadnica 电池化学:镍镉 可充电:是 电池大小:D 单元数:10 电压 - 额定:12V 容量:4Ah 结构:正面至背面,5 排 x 2 芯电池 端接类型:焊片 尺寸/尺寸:6.42" L x 1.28" W x 4.63" H(163.0mm x 32.6mm x 117.6mm) 重量:3.5 磅(1.6kg) 请注意:- 配用:SY125-ND - BATT NICAD 1.2V D 4000MAH 其它名称:SY125-L025