参数资料
型号: 1215E
英文描述: TEST/JTAG SUPPORT|CMOS|QFP|48PIN|PLASTIC
中文描述: 测试/ JTAG支持|的CMOS | QFP封装| 48PIN |塑料
文件页数: 85/92页
文件大小: 1041K
代理商: 1215E
86
Agere Systems Inc.
User Manual
April 2001
Advanced Operational Mode
497AE and 1215E Boundary-Scan Master 2
Appendix E—BSM2 Operation as a Function of Phase Relation of TCK and TCKIN
at High Speeds with Low-Valued Clock Divider (continued)
Case 2: Consider TCK and TCKIN with identical frequency (clock divider of 1, again) and TCKIN = 65 MHz (fmax).
The timing diagram is shown in Figure 19. Now the propagation delays and set up and hold times are on
the order of the period of TCKIN (15.4 ns). One may have to clean up or deskew the phases of the signals
with extra latches, depending on the particular application. In this case one would have to use the retimed
delay function (not available when TDI inputs to the SAR) to accommodate for the phase delay of TDI.
Also, the set up and hold specifications of TDI would have to be carefully evaluated.
TCK (inverted) lags TCKIN by approximately 11 ns. TMS and TDO are delayed by 15 ns—almost one full
period. So already the TDO data are one clock delayed—even if TDO was directly connected to TDI, we
have lost one clock cycle. This can be corrected by using the retimed delay register.
Now the set up and hold values for TDI become much tighter with respect to the total period (box B), so
some custom circuit phasing must be incorporated.
Note, in the diagram, that the data input cycle
N is one clock behind. The TDO signal has to drive a B-S
chain that returns the signal on TDI; so even in loopback mode, we’ve lost one clock cycle. Therefore, it is
necessary to set the BSM2 for a retimed delay value of 1. Now the BSM2 will store the value sampled dur-
ing data input cycle
N + 1 as if it had been captured during data input cycle N. In a loopback mode, the
input and output test data would be synchronized properly.
Figure 19. Relationships of TCKIN, TCK, TDI, TDO, and TMS with TCKIN Frequency of 65 ns and TMS
Defined by Clock Divider Value of 1
TDI is sampled wrt TCKIN
(set up 10 ns, hold 5 ns)
TCKIN
TCK
TMS,TDO
TDI
10 ns
5 ns
Phase
N
Phase
N
Output Data
N
Input Data
N
Output Data
N - 1
Output Data
N + 1
Input Data
N + 1
BSM2 samples TDI here.
B
BSM2 stores sampled data
as if it had been sampled here.
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